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Microscope Probe Product List

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other measurement, recording and measuring instruments

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

  • probe
  • Other microscopes

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